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Electron microscope Product List and Ranking from 15 Manufacturers, Suppliers and Companies | IPROS GMS

Last Updated： Aggregation Period:Feb 04, 2026～Mar 03, 2026
This ranking is based on the number of page views on our site.

Electron microscope Manufacturer, Suppliers and Company Rankings

Last Updated： Aggregation Period:Feb 04, 2026～Mar 03, 2026
This ranking is based on the number of page views on our site.

  1. アズサイエンス 松本本社 Nagano//Trading company/Wholesale
  2. 一般財団法人材料科学技術振興財団　MST Tokyo//Testing, Analysis and Measurement
  3. ロンビック Mie//Resin/Plastic
  4. 関西電力送配電 技術試験センター Hyogo//Electricity, Gas and Water Industry
  5. 5 アイテス Shiga//Electronic Components and Semiconductors
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Electron microscope Product ranking

Last Updated： Aggregation Period:Feb 04, 2026～Mar 03, 2026
This ranking is based on the number of page views on our site.

  1. In various fields such as the semiconductor industry, polymer material development and research, and quality control! アズサイエンス 松本本社
  2. [Introduction of Testing Equipment] Multi-Angle Lens VHX-D510 関西電力送配電 技術試験センター
  3. Observation of Cellulose Nanofibers (CNF) - Examples of SEM and TEM Observations ロンビック
  4. 4 JEM-1400Flash Electron Microscope アズサイエンス 松本本社
  5. 5 Observation of the diffusion layer of SiC MOSFET using LV-SEM and EBIC methods. アイテス

Electron microscope Product List

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Observation of dislocations in GaN using the SEM-ECCI method.

Observation of dislocations in GaN using the SEM-ECCI method.

Using the SEM-ECCI method, observation becomes possible with easy preprocessing! We will also introduce measurement examples of single crystal GaN.

Our company conducts dislocation observation of GaN using the SEM-ECCI method. In power semiconductors such as Gallium Nitride (GaN), dislocations present during manufacturing are considered factors that lead to decreased device performance and shortened lifespan. Dislocation observation in semiconductors is mainly performed using Transmission Electron Microscopy (TEM) or the Etch Pit method; however, using the SEM-ECCI method allows for observation with easy pre-treatment. [Measurement Example] - Sample: Single crystal GaN (wafer with GaN deposited on a sapphire substrate) - Surface Orientation: C-plane (0001) ±0.5° - GaN Film Thickness: 4.5 ± 0.5 μm - Measurement Conditions: Backscattering mode *For more details, please refer to the related links or feel free to contact us.

  • Contract measurement
  • Electron microscope

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Observation of GaN defects using forward scattering electrons in SEM.

Observation of GaN defects using forward scattering electrons in SEM.

Dislocations and steps (tiny steps) as well as small orientation differences in power semiconductors such as GaN can be observed.

In power semiconductors such as GaN, atomic-level defects affect performance degradation. By evaluating forward-scattered electrons using an EBSD detector, it becomes possible to observe dislocations as well as steps (small height differences) and micro-orientation differences.

  • Contract Analysis
  • Electron microscope

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[Case Analysis] Pathogenic Escherichia coli O-157

[Case Analysis] Pathogenic Escherichia coli O-157

Analyzing a bacterium known as one of the causes of collective food poisoning using ×30,000 magnification with 1: TEM and 2: SEM!

We would like to introduce a case study of the analysis of "pathogenic Escherichia coli O-157" conducted by our company. "O-157" has recently become known as one of the bacteria responsible for foodborne outbreaks, and elucidating the mechanism of its verotoxin production is an urgent task. Bacteria have a cell wall surrounding them, making it difficult for chemicals such as fixatives to penetrate. The sample preparation method is fundamentally similar to that of animal tissues, but the image quality can be improved by extending the processing time and performing fixation at room temperature. 【Analysis Overview】 ■ Target of Analysis: Pathogenic Escherichia coli O-157 ■ Sample Preparation Method: Essentially similar to animal tissues - Image quality is improved by extending processing time and performing fixation at room temperature. *For more details, please refer to the PDF document or feel free to contact us.

  • Contract Analysis
  • Electron microscope

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Observation of the diffusion layer of SiC MOSFET using LV-SEM and EBIC methods.

Observation of the diffusion layer of SiC MOSFET using LV-SEM and EBIC methods.

Even with SiC power devices, we can provide consistent support for cross-section preparation of specific areas, observation of diffusion layer shapes, as well as wiring structure and crystal structure analysis!

Our company conducts observations of the diffusion layer of SiC MOSFETs using LV-SEM and EBIC methods. We can perform cross-section fabrication of specific areas using FIB, shape observation of the diffusion layer using LV-SEM/EBIC, and further through analyses of wiring structures and crystal structures using TEM, all applicable to SiC power devices. In "LV-SEM diffusion layer observation," secondary electrons (SE2) influenced by the built-in potential of the PN junction are detected with the Inlens detector. The shape of the diffusion layer can be visualized through SEM observation of the FIB cross-section. [Analysis methods using EBIC] ■ PEM/OBIRCH defect location identification ■ FIB cross-section processing ■ Low acceleration SEM ■ EBIC analysis ■ TEM *For more details, please refer to the PDF document or feel free to contact us.

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  • Analysis Services
  • Contract Analysis
  • Electron microscope

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Crack observation using a tabletop SEM (scanning electron microscope).

Crack observation using a tabletop SEM (scanning electron microscope).

Fine cracks are easy to see! No conductive treatment is required, allowing for quick and detailed observation.

Introducing "Crack Observation Using Tabletop SEM (Scanning Electron Microscope)." In the evaluation of product reliability, cross-sectional observation of cracks is essential. While optical microscopy may overlook small cracks, SEM observation allows for clear identification. Moreover, with a tabletop SEM, no conductive treatment is necessary, enabling quick and detailed observation. 【Features】 ■ No need for deposition ■ Easy visibility of crystal grains ■ Fine cracks are easily visible *For more details, please refer to the PDF document or feel free to contact us.

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  • Electron microscope
  • Contract Analysis
  • Contract Inspection
  • Electron microscope

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Observation of the coating film

Observation of the coating film

Introducing examples of observation and analysis of coating films used in various products, including "microtomes" capable of planar inclined cutting!

We will introduce examples of observation and analysis of coating films used in various products such as automobiles and mobile phones. The "Triple Ion Polisher (CP)" can process samples containing both hard and soft materials without causing damage, while the "Microtome" is capable of not only producing cross-sections but also performing planar inclined cutting. Additionally, the "Desktop Inclined Cutting Machine" can extract sample surfaces that are 6 to 300 times the original thickness as surface information, and the "Desktop SEM (Scanning Electron Microscope)" has a mode for observation under low vacuum (charge reduction), allowing for the observation and elemental analysis of samples that release volatile components. [Observation of Plastic Coating (Mobile Phone Case)] ■ Triple Ion Polisher (CP) ■ Microtome ■ Desktop Inclined Cutting Machine ■ Desktop SEM (Scanning Electron Microscope) *For more details, please refer to the PDF document or feel free to contact us.

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  • Analytical Equipment and Devices
  • Other environmental analysis equipment
  • Electron microscope

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[Analysis Case] Evaluation of Specific Crystalline Grains in CIGS Thin-Film Solar Cells

[Analysis Case] Evaluation of Specific Crystalline Grains in CIGS Thin-Film Solar Cells

Observation of orthogonal cross-sections at locations with characteristics identified in EBIC measurements of arbitrary cross-sections.

Insights into the relationship between electrical properties and crystals can be obtained through EBIC and EBSD, but the depth of information differs. For areas where electrical properties were characteristic in the EBIC distribution measurement, we created cross-sectional samples and conducted STEM imaging in the depth direction. Additionally, we measured electron diffraction for each crystal grain. This further clarified the relationship between electrical properties and crystal grains and grain boundaries. By performing STEM observation and electron diffraction measurements, it is possible to obtain localized information about specific crystal grains.

  • Contract Analysis
  • Electron microscope

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[Analysis Case] Evaluation of the Mixed State of the Active Layer in Organic Thin-Film Solar Cells

[Analysis Case] Evaluation of the Mixed State of the Active Layer in Organic Thin-Film Solar Cells

Evaluation of the distribution state of organic materials using low-energy STEM observation and EELS measurement.

By using low-energy STEM observation and STEM-EELS surface analysis, we evaluated the mixed state of the active layer in bulk heterojunction solar cells. For the evaluation, samples were prepared with only the active layer deposited on ITO. The contrast in the low-energy STEM image (Photo 1) corresponds to the elemental distribution of S and C in the STEM-EELS images (Photos 2 and 3), confirming that it reflects the bulk heterostructure. Additionally, a bias in the distribution of S was observed, suggesting that P3HT is segregated towards the surface side.

  • Contract Analysis
  • Electron microscope

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[Analysis Case] Cross-sectional Observation and Elemental Analysis of Soft Materials

[Analysis Case] Cross-sectional Observation and Elemental Analysis of Soft Materials

Direct evaluation of the structure of solution samples through cryo-SEM observation and EDX analysis.

To observe and analyze the internal structure of organic materials and liquid samples that are sensitive to heat, it is necessary to suppress temperature increases caused by processing or electron beam irradiation and to conduct a series of analyses while maintaining the original structure of the sample. In this case study, we will introduce an example where a cosmetic was used as an evaluation sample, and structural analysis was performed from cross-section FIB processing to SEM observation and EDX analysis while maintaining a cooling environment.

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  • Electron microscope

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[Analysis Case] Observation of Emulsions in Cryo FIB-SEM Processed Food

[Analysis Case] Observation of Emulsions in Cryo FIB-SEM Processed Food

Observe the dispersion state of moisture and oil while maintaining the structure.

Emulsions are dispersion systems in which water-soluble and fat-soluble components are mixed without separation due to the action of emulsifiers, and various emulsion technologies are widely used in processed foods. Mayonnaise is a representative processed food of the O/W type (oil-in-water emulsion). As a result of evaluation using cryo FIB-SEM observation, we were able to visualize the distribution of water, oil, emulsifiers, and other components. By conducting magnified observations, we can evaluate the fine structure, which is expected to be applied to sensory evaluations such as the smoothness and flavor of food.

  • Contract Analysis
  • Electron microscope

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[Analysis Case] Atomic Level Structural Analysis of CIGS Thin-Film Solar Cells

[Analysis Case] Atomic Level Structural Analysis of CIGS Thin-Film Solar Cells

Atomic-level resolution EDX analysis using Cs-corrected STEM.

By using a Cs-corrected TEM device that compensates for spherical aberration, it is possible to observe the cross-sectional structure of devices with high resolution. This case presents data from high-resolution (HR)-STEM observation and EDX elemental distribution analysis of the light-absorbing layer of CIGS thin-film solar cells. In CIGS, which has a polycrystalline structure composed of four elements, atomic resolution EDX analysis was performed, visually revealing the distribution of atoms.

  • Contract Analysis
  • Electron microscope

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[Analysis Case] Evaluation of Particle Size and Composition of Catalyst Materials using TEM and EDX

[Analysis Case] Evaluation of Particle Size and Composition of Catalyst Materials using TEM and EDX

Evaluation of catalyst particles using STEM-EDX.

The electrodes of fuel cells are supported by Pt particles or Pt alloy (such as PtRu) particles as catalysts on carbon. Due to the fine structure of these catalyst particles, which are on the order of a few nanometers, SEM and TEM analyses are used for morphological observation and compositional analysis. In addition to evaluations in the initial state, degradation after current application has been reported, including modulation of alloy composition, leaching of Ru, and an increase in the diameter of catalyst particles; HAADF observation and high-resolution EDX analysis are very effective for these evaluations. Furthermore, multi-field observation and analysis enable the assessment of particle size and compositional distribution.

  • Contract Analysis
  • Electron microscope

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[Analysis Case] Investigation of Voids Inside Bonded Wafers Using C-SAM

[Analysis Case] Investigation of Voids Inside Bonded Wafers Using C-SAM

We will evaluate the internal structure of the device in a comprehensive manner.

MST offers a range of technologies suitable for evaluating the internal structures of electronic devices, and we propose analytical methods tailored to the observation field and objectives. This document presents case studies investigating specific areas of devices using X-ray CT and FIB-SEM. First, we observed the internal structure of the entire sample using X-ray CT to explore specific areas. Next, we used FIB-SEM to examine the detailed structures of the specific features identified on the vias.

  • Contract Analysis
  • Other electronic parts
  • Electron microscope

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[Analysis Case] 3D Observation of Cosmetics Using X-ray CT and Cryo-SEM

[Analysis Case] 3D Observation of Cosmetics Using X-ray CT and Cryo-SEM

It is possible to confirm the shape of emulsified particles and inorganic powders! Visualizing the film of liquid foundation from macro to micro levels.

We would like to introduce a case study of 3D observation of cosmetics using X-ray CT and cryo-SEM, analyzed by the foundation. Liquid foundation applied to a plastic substrate was observed using X-ray CT and cryo-SEM, visualizing the dispersion state within the sample. X-ray CT allows for the confirmation of macroscopic morphology in a non-destructive and non-contact manner, while cryo-SEM enables the observation of even more microscopic structures. 【Features】 ■ The internal structure of the liquid foundation film can be evaluated through macroscopic morphological observation. ■ Detailed structural observation using an electron microscope allows for the confirmation of the shapes of emulsified particles and inorganic powders. *For more details, please refer to the PDF document or feel free to contact us.

  • Contract Analysis
  • Electron microscope

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[Analysis Case] Structural Evaluation of Positive Electrode Active Material in Secondary Batteries

[Analysis Case] Structural Evaluation of Positive Electrode Active Material in Secondary Batteries

Evaluation of particle size and crystal orientation of living materials, atomic-level observation is possible.

Lithium-ion secondary batteries undergo changes in the composition and crystal structure of the electrode active materials due to ion extraction and insertion during charging and discharging. As a structural evaluation of the positive electrode active material Li(NiCoMn)O2 (NCM), we assessed the particle size and orientation of primary particles using EBSD. Furthermore, we conducted high-resolution STEM observations on the primary particles whose orientations were confirmed, showcasing the atomic positions of light elements (Li, O) in ABF-STEM images and the atomic positions of transition metals (Ni, Co, Mn) in HAADF-STEM images. Measurement methods: SEM, EBSD, TEM Product field: Secondary batteries Analysis purpose: Shape evaluation, structural evaluation, product investigation For more details, please download the materials or contact us.

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  • Charger
  • Contract measurement
  • Electron microscope

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[Analysis Case] Evaluation of Ion Implantation Damage Layer in Gallium Oxide Ga2O3

[Analysis Case] Evaluation of Ion Implantation Damage Layer in Gallium Oxide Ga2O3

Confirming the differences due to variations in annealing conditions after ion implantation.

Gallium oxide (Ga2O3) has a wider bandgap than SiC and GaN, and possesses excellent physical properties, making it a focus of attention as a material for power devices that can be expected to be high-efficiency and low-cost. Controlling impurity concentration and crystallinity, which influence the characteristics of the devices, is crucial for their development. This document presents the results of observations of the damage layer and changes in surface roughness caused by disturbances in the crystal structure due to ion implantation, under various annealing conditions. Measurement methods: TEM, AFM Product fields: Oxide semiconductors, power devices Analysis objectives: Shape evaluation, structural evaluation For more details, please download the document or contact us.

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  • Contract Analysis
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  • Electron microscope

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Identification of resistance anomalies due to absorption current

Identification of resistance anomalies due to absorption current

You can identify high resistance and open areas in the wiring from the absorption current image.

- Possible to identify high resistance abnormal areas - The current flowing through the wiring is weak (pA) - Measurement is possible even with a surface protective film present - Measurement is possible even with multilayered wiring - Measurement is possible under conditions almost identical to SEM observation

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  • Electron microscope

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[Analysis Case] STEM, EBSD Image Simulation for Polycrystalline Structure Analysis

[Analysis Case] STEM, EBSD Image Simulation for Polycrystalline Structure Analysis

Evaluation of crystal forms using simulations.

High-resolution HAADF-STEM images reflect the atomic arrangement of crystals, and by simulating STEM images corresponding to various crystal orientations, they help in accurately understanding the relative orientations between crystal grains and the observed images in polycrystalline materials. This document presents a case where STEM images were simulated from the crystal orientation information obtained by the EBSD method for the crystal grains in a polycrystalline neodymium magnet, and compares them with actual high-resolution HAADF-STEM images.

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  • Contract Analysis
  • Contract measurement
  • Electron microscope

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Case Study Collection 1 on Cross-Section Observation and Structural Analysis using TEM/SEM/EBSD

Case Study Collection 1 on Cross-Section Observation and Structural Analysis using TEM/SEM/EBSD

We will introduce many examples of cross-sectional observation and structural analysis using TEM, FE-SEM, EBSD, etc., for metal microstructure observation and phase analysis!

This case study collection introduces examples related to "cross-sectional observation and structural analysis." It includes numerous analytical cases covering the objectives, methods, and results of "metallic structure observation of wire (spring material)," "phase analysis of duplex stainless steel," and "evaluation of semiconductor insulating films using STEM-EDS." Additionally, it presents observations, phase analyses, insulating film analyses, and measurements, among other topics. We encourage you to read it. [Contents] ■ Metallic structure observation of wire (spring material) ■ Phase analysis of duplex stainless steel ■ Evaluation of semiconductor insulating films using STEM-EDS ■ EBSD measurement of samarium cobalt magnets ■ Analysis of connector terminal contact defects using STEM ■ Cross-sectional observation of biological samples (Morpho butterfly scales) *For more details, please refer to the PDF document or feel free to contact us.

  • Other analyses
  • Contract Analysis
  • Contract Analysis
  • Electron microscope

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Examples of observing plastics and resin materials using TEM and SEM.

Examples of observing plastics and resin materials using TEM and SEM.

Introducing observations of CNF in PE and the higher-order structure of cell walls in PE foams, along with photos!

On our company website, we introduce examples of resin material observation using transmission electron microscopy (TEM) and scanning electron microscopy (SEM). In the TEM observation examples, we include observations of CNF in PE, the higher-order structure of cell walls in PE foams, and the lamellar structure near the surface of HDPE. Additionally, in the SEM observation examples, we present comparisons before and after weather resistance tests of ABS resin, as well as cross-sectional structural analysis of automotive bumper materials. Please take a look. [Content Included (Partial)] ■ TEM Observation Examples - Observation of CNF in PE - Higher-order structure of cell walls in PE foams - Observation of lamellar structure near the surface of HDPE - Morphology observation examples of HIPS/ABS systems - Morphology observation in PC/ABS system materials *For more details, please refer to the related links or feel free to contact us.

  • Contract Analysis
  • Electron microscope

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[Analysis Case] Observation of the Dispersion State of Fillers in Automotive Resins

[Analysis Case] Observation of the Dispersion State of Fillers in Automotive Resins

Quantitative evaluation of fillers blended into resin is possible! Here is an example of understanding the dispersion state per volume of filler.

In the fields of automobiles and aircraft, lightweight organic/inorganic composite materials with strength and rigidity are widely used. The size and dispersion state of inorganic fillers contained in organic/inorganic composite materials significantly affect mechanical properties, making it necessary to understand the distribution and orientation of inorganic fillers. This document presents a case study where fillers within a resin were evaluated in three dimensions using FIB-SEM. [Case Summary] ■ Analysis Sample - Automotive resin containing inorganic fillers ■ Analysis Results - It was found that the resin contains approximately 10Vol% of fillers. *For more details, please refer to the PDF document or feel free to contact us.

  • Contract Analysis
  • Electron microscope

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Introduction to the Equipment of the Technology Development Office

Introduction to the Equipment of the Technology Development Office

We own microscopes and electron microscopes! We provide consistently stable quality plating using various analytical devices.

In our Technology Development Department, we analyze and manage the plating solutions from three factories using various analytical devices. By understanding the consumption of chemicals due to plating operations and controlling the supply amounts, we strive to consistently provide stable quality plating. Additionally, in 2015, we introduced a scanning electron microscope to conduct surface analysis and evaluation of plating films. By observing at the micron level, we clarify issues that are not noticeable to the naked eye, and we research plating conditions that match the surface state to our customers' needs. 【Equipment Owned (Partial)】 ■ Microscope ■ Electron Microscope, manufactured by JEOL: "SM-6010PLUS/LA" ■ Polishing Machine, manufactured by Sankeikaku: Automatic Polishing Machine "HA-FSA-83" ■ Cutting Machine, manufactured by Sankeikaku: Cutting Machine Alt Cut "CK260-90" ■ Manufactured by Shimadzu: Spectrophotometer "UVmini-1240" ■ Manufactured by Matsuzawa: Digital Microhardness Tester "SMT-3" *For more details, please refer to the PDF document or feel free to contact us.

  • Plating Equipment
  • Contract manufacturing
  • Electron microscope

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Technical Data: Electrode Deposits (Contacts)

Technical Data: Electrode Deposits (Contacts)

Introducing a case study that investigated contact surfaces with poor conductivity through electron microscope observation!

Our company is engaged in the analysis solution business. This document presents cases where non-contact, non-destructive observation of contact surfaces that experienced poor conductivity was conducted using an electron microscope at magnifications of 40 to 250 times, allowing for the observation of contaminants on the contact surfaces. By identifying the contaminants through qualitative elemental analysis using fluorescent X-ray analysis and qualitative compound analysis using micro-infrared spectroscopy, we can clarify the adhesion mechanism of the identified contaminants to the contacts, enabling an investigation into the causes of poor conductivity. [Contents] ■ Overview ■ Features ■ Analysis Cases - Electron Microscope Observation - Fluorescent X-ray Analysis, Micro-infrared Spectroscopy *For more details, please refer to the PDF document or feel free to contact us.

  • Analytical Equipment and Devices
  • Other services
  • Electron microscope

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Learning from Japan Electron Optics Laboratory, a long-established manufacturer of electron microscopes, about after-sales service reform.

Learning from Japan Electron Optics Laboratory, a long-established manufacturer of electron microscopes, about after-sales service reform.

Centralized management of basic information and related information for 40,000 parts using PIM/DAM, and renewal of the after-sales service system that serves as the front for customer service.

Revamping the after-sales service system, which serves as the front for customer service. We will introduce the case of Japan Electronics, which built a new system utilizing Contentserv's PIM (Product Information Management) / DAM (Digital Asset Management) and integrated it with existing ERP and e-commerce sites, thereby solving traditional challenges all at once. [Contents] - Revamping the after-sales service system, which serves as the front for customer service - Seeking PIM/DAM tools that are more user-friendly and accessible - Solving technical challenges together with EXA, who joined the project from the construction phase - Contributing to groundbreaking operational efficiency and improved customer satisfaction *For more details on the research report, please refer to "PDF Download."

  • others
  • Electron microscope

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In various fields such as the semiconductor industry, polymer material development and research, and quality control!

In various fields such as the semiconductor industry, polymer material development and research, and quality control!

Introduction of recommended electron microscopes, photoelectron spectrometers, and internal oblique compound microscopes by Azusa Science.

We would like to introduce three recommended products from Azusa Science. ◆ JEOL Ltd. JEM-1400Flash Electron Microscope This transmission electron microscope features a high-sensitivity sCMOS camera, an ultra-wide field montage system, and an enhanced linking function between optical microscope images and electron microscope images. It is utilized across a wide range of fields, including biology, nanotechnology, polymers, and advanced materials. ◆ JEOL Ltd. JPS-9030 X-ray Photoelectron Spectroscopy (XPS) System Equipped with a Kaufman-type etching ion source and twin anodes as standard, this versatile XPS system also offers extensive expandability with high-temperature heating systems and gas cluster ion sources. It is widely used from universities to factories as a highly versatile analytical method in material research and development, as well as in quality control. ◆ Nikon Solutions Co., Ltd. Internal Oblique Stereo Microscope SMZ445/460 This stereo zoom microscope series from Nikon boasts excellent optical performance similar to that of their cutting-edge models. It is suitable for inspecting and observing resin molded products and metal processed parts. It meets the needs for component inspection and quality control.

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  • Electron microscope

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Information on morphological observation and component analysis using an electron microscope.

Information on morphological observation and component analysis using an electron microscope.

It is capable of various analyses such as point analysis, line analysis, and mapping in the sample area, as well as multifunctional component analysis.

The Tokai Technical Center, a general incorporated foundation, offers "morphological observation and component analysis using an electron microscope." Observations can be made without the time-consuming and labor-intensive pre-treatment, resulting in reduced time until observation and easier evaluation of component analysis after observation. Additionally, simultaneous composition observation allows for understanding the distribution of different compositions while performing morphological observation. Distance measurement between two points of interest within the sample is also possible. 【Features】 - Observations can be made without the time-consuming and labor-intensive pre-treatment. - Simultaneous composition observation allows for understanding the distribution of different compositions. - Distance measurement between two points of interest within the sample is possible. - Point analysis, line analysis, and mapping within the sample area are also possible. *For more details, please refer to the PDF document or feel free to contact us.

  • Contract Analysis
  • Electron microscope

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[Analysis/Test] Introducing a case of 50% reduction in outsourcing costs from existing manufacturers!

[Analysis/Test] Introducing a case of 50% reduction in outsourcing costs from existing manufacturers!

Specialized in contract analysis/testing! Introducing examples of electron microscope observation/component analysis and solution analysis (ICP-MC)! Leave the comparison and consideration of contract analysis/testing to us!

We would like to introduce a case where we proposed an evaluation and analysis manufacturer for outsourcing contracts. In the field of battery-related electron microscope observation/component analysis, our proposal resulted in a 40% reduction in outsourcing costs compared to existing manufacturers. Additionally, in the area of material-related solution analysis (ICP-MC), our proposal led to a 50% reduction in outsourcing costs compared to existing manufacturers. [Case Summary] ■ Battery-related electron microscope observation/component analysis: 40% reduction in outsourcing costs ■ Material-related solution analysis (ICP-MC): 50% reduction in outsourcing costs We are also capable of handling a wide range of analyses/tests beyond the above. For more details, please refer to the PDF document or feel free to contact us.

  • Public Testing/Laboratory
  • Electron microscope

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[Data] Case Study of Material System Analysis

[Data] Case Study of Material System Analysis

It is possible to prepare sections ranging from 30nm to 5μm! This document introduces several case studies of material analysis!

This document is a collection of case studies summarizing material analysis conducted by Hanai Corporation's Electron Microscope Technology Research Institute. The "Ultra Microtome" is suitable for producing high-quality ultra-thin sections and cross-sections across a wide range of fields, including biological tissues, metal plating layers, inorganic deposition layers, and nanoparticles. Our company has started offering contract analysis services. We will conduct material analysis in collaboration with partner organizations. [Published Cases] - Structural analysis of liposomes - Structural analysis of HIPS - Structural analysis of lens cross-sections - Cross-sectional observation of candy bags - Morphological observation of metal particles using the dispersion method (metal microparticles/metal-supported carbon) *For more details, please refer to the PDF document or feel free to contact us.

  • Contract Analysis
  • Electron microscope
  • Other microscopes
  • Electron microscope

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[Case Analysis] Hepatocytes (Pig Liver)

[Case Analysis] Hepatocytes (Pig Liver)

Insert photo ×7,000 Analysis of the cell membrane (×100,000)! It can be seen that the cell membrane has a double structure approximately 7nm wide.

We would like to introduce a case study of the analysis of 'hepatocytes (pig liver)' conducted by our company. The liver has many functions, including lipid and protein synthesis, metabolism and removal of drugs, and energy storage, most of which are composed of hepatocytes. There are also other components such as bile canaliculi (BC) and blood vessels (HS), within which blood cells (EC, Kf) can be observed. The inserted photo shows an enlargement of the cell membranes of adjacent cells, revealing that each cell membrane has a double structure approximately 7nm wide. Additionally, hepatocytes possess typical organelles that are often referenced when explaining the structure and function of general cells. [Analysis Overview] ■ Analysis Subject: Hepatocytes (pig liver) ■ It is evident that each cell membrane has a double structure approximately 7nm wide. ■ Hepatocytes have typical organelles that are frequently cited when explaining the structure and function of general cells. *For more details, please refer to the PDF document or feel free to contact us.

  • Contract Analysis
  • Electron microscope

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Basic Analysis Methods for Things that are Similar Yet Different

Basic Analysis Methods for Things that are Similar Yet Different

Introducing the flow from optical microscope observation with a wide range of applications to SEM observation and EDX elemental analysis!

We will introduce the flow from basic and widely applicable optical microscope observation to SEM observation and EDX elemental analysis. Observation using an optical microscope is one of the fundamental observation techniques, allowing for quick examination of general shapes and other features. Its advantage lies in the ability to obtain color information, making it effective for observing abnormalities associated with corrosion and other changes. In this document, we also provide detailed explanations of "observation using SEM" and "elemental analysis using EDX" with the help of photos and graphs. We encourage you to read it. [Contents] ■ Observation using an optical microscope ■ Observation using SEM ■ Elemental analysis using EDX *For more details, please refer to the PDF document or feel free to contact us.

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  • Other contract services
  • Electron microscope

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