Electron microscope Product List and Ranking from 16 Manufacturers, Suppliers and Companies

Last Updated：Oct 15, 2025 Aggregation Period:Sep 17, 2025～Oct 14, 2025
This ranking is based on the number of page views on our site.

Electron microscope Manufacturer, Suppliers and Company Rankings

Last Updated：Oct 15, 2025 Aggregation Period:Sep 17, 2025～Oct 14, 2025
This ranking is based on the number of page views on our site.

ロンビック Mie//Resin/Plastic
一般財団法人材料科学技術振興財団　MST Tokyo//Testing, Analysis and Measurement
関西電力送配電技術試験センター Hyogo//Electricity, Gas and Water Industry
4 アイテス Shiga//Electronic Components and Semiconductors
5 アズサイエンス松本本社 Nagano//Trading company/Wholesale

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Electron microscope Product ranking

Last Updated：Oct 15, 2025 Aggregation Period:Sep 17, 2025～Oct 14, 2025
This ranking is based on the number of page views on our site.

Examples of observing plastics and resin materials using TEM and SEM. ロンビック
[Analysis Case] Morphological Observation and Component Analysis of Solid Polymer Fuel Cell Catalyst Materials 一般財団法人材料科学技術振興財団　MST
Observation of Cellulose Nanofibers (CNF) - Examples of SEM and TEM Observations ロンビック
4 [Introduction of Testing Equipment] Multi-Angle Lens VHX-D510 関西電力送配電技術試験センター
5 Crack observation using a tabletop SEM (scanning electron microscope). アイテス

Electron microscope Product List

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Observation of dislocations in GaN using the SEM-ECCI method.

Using the SEM-ECCI method, observation becomes possible with easy preprocessing! We will also introduce measurement examples of single crystal GaN.

Our company conducts dislocation observation of GaN using the SEM-ECCI method. In power semiconductors such as Gallium Nitride (GaN), dislocations present during manufacturing are considered factors that lead to decreased device performance and shortened lifespan. Dislocation observation in semiconductors is mainly performed using Transmission Electron Microscopy (TEM) or the Etch Pit method; however, using the SEM-ECCI method allows for observation with easy pre-treatment. [Measurement Example] - Sample: Single crystal GaN (wafer with GaN deposited on a sapphire substrate) - Surface Orientation: C-plane (0001) ±0.5° - GaN Film Thickness: 4.5 ± 0.5 μm - Measurement Conditions: Backscattering mode *For more details, please refer to the related links or feel free to contact us.

Company：大同分析リサーチ
Price：Other

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Observation of GaN defects using forward scattering electrons in SEM.

Dislocations and steps (tiny steps) as well as small orientation differences in power semiconductors such as GaN can be observed.

In power semiconductors such as GaN, atomic-level defects affect performance degradation. By evaluating forward-scattered electrons using an EBSD detector, it becomes possible to observe dislocations as well as steps (small height differences) and micro-orientation differences.

Company：大同分析リサーチ
Price：Other

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[Case Analysis] Pathogenic Escherichia coli O-157

Analyzing a bacterium known as one of the causes of collective food poisoning using ×30,000 magnification with 1: TEM and 2: SEM!

We would like to introduce a case study of the analysis of "pathogenic Escherichia coli O-157" conducted by our company. "O-157" has recently become known as one of the bacteria responsible for foodborne outbreaks, and elucidating the mechanism of its verotoxin production is an urgent task. Bacteria have a cell wall surrounding them, making it difficult for chemicals such as fixatives to penetrate. The sample preparation method is fundamentally similar to that of animal tissues, but the image quality can be improved by extending the processing time and performing fixation at room temperature. 【Analysis Overview】 ■ Target of Analysis: Pathogenic Escherichia coli O-157 ■ Sample Preparation Method: Essentially similar to animal tissues - Image quality is improved by extending processing time and performing fixation at room temperature. *For more details, please refer to the PDF document or feel free to contact us.

Company：花市電子顕微鏡技術研究所
Price：Other

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Observation of the diffusion layer of SiC MOSFET using LV-SEM and EBIC methods.

Even with SiC power devices, we can provide consistent support for cross-section preparation of specific areas, observation of diffusion layer shapes, as well as wiring structure and crystal structure analysis!

Our company conducts observations of the diffusion layer of SiC MOSFETs using LV-SEM and EBIC methods. We can perform cross-section fabrication of specific areas using FIB, shape observation of the diffusion layer using LV-SEM/EBIC, and further through analyses of wiring structures and crystal structures using TEM, all applicable to SiC power devices. In "LV-SEM diffusion layer observation," secondary electrons (SE2) influenced by the built-in potential of the PN junction are detected with the Inlens detector. The shape of the diffusion layer can be visualized through SEM observation of the FIB cross-section. [Analysis methods using EBIC] ■ PEM/OBIRCH defect location identification ■ FIB cross-section processing ■ Low acceleration SEM ■ EBIC analysis ■ TEM *For more details, please refer to the PDF document or feel free to contact us.

Company：アイテス
Price：Other

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Crack observation using a tabletop SEM (scanning electron microscope).

Fine cracks are easy to see! No conductive treatment is required, allowing for quick and detailed observation.

Introducing "Crack Observation Using Tabletop SEM (Scanning Electron Microscope)." In the evaluation of product reliability, cross-sectional observation of cracks is essential. While optical microscopy may overlook small cracks, SEM observation allows for clear identification. Moreover, with a tabletop SEM, no conductive treatment is necessary, enabling quick and detailed observation. 【Features】 ■ No need for deposition ■ Easy visibility of crystal grains ■ Fine cracks are easily visible *For more details, please refer to the PDF document or feel free to contact us.

Company：アイテス
Price：Other

Electron microscope
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Observation of the coating film

Introducing examples of observation and analysis of coating films used in various products, including "microtomes" capable of planar inclined cutting!

We will introduce examples of observation and analysis of coating films used in various products such as automobiles and mobile phones. The "Triple Ion Polisher (CP)" can process samples containing both hard and soft materials without causing damage, while the "Microtome" is capable of not only producing cross-sections but also performing planar inclined cutting. Additionally, the "Desktop Inclined Cutting Machine" can extract sample surfaces that are 6 to 300 times the original thickness as surface information, and the "Desktop SEM (Scanning Electron Microscope)" has a mode for observation under low vacuum (charge reduction), allowing for the observation and elemental analysis of samples that release volatile components. [Observation of Plastic Coating (Mobile Phone Case)] ■ Triple Ion Polisher (CP) ■ Microtome ■ Desktop Inclined Cutting Machine ■ Desktop SEM (Scanning Electron Microscope) *For more details, please refer to the PDF document or feel free to contact us.

Company：アイテス
Price：Other

Analytical Equipment and Devices
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[Analysis Case] Evaluation of Specific Crystalline Grains in CIGS Thin-Film Solar Cells

Observation of orthogonal cross-sections at locations with characteristics identified in EBIC measurements of arbitrary cross-sections.

Insights into the relationship between electrical properties and crystals can be obtained through EBIC and EBSD, but the depth of information differs. For areas where electrical properties were characteristic in the EBIC distribution measurement, we created cross-sectional samples and conducted STEM imaging in the depth direction. Additionally, we measured electron diffraction for each crystal grain. This further clarified the relationship between electrical properties and crystal grains and grain boundaries. By performing STEM observation and electron diffraction measurements, it is possible to obtain localized information about specific crystal grains.

Company：一般財団法人材料科学技術振興財団　MST
Price：Other

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[Analysis Case] Evaluation of the Mixed State of the Active Layer in Organic Thin-Film Solar Cells

Evaluation of the distribution state of organic materials using low-energy STEM observation and EELS measurement.

By using low-energy STEM observation and STEM-EELS surface analysis, we evaluated the mixed state of the active layer in bulk heterojunction solar cells. For the evaluation, samples were prepared with only the active layer deposited on ITO. The contrast in the low-energy STEM image (Photo 1) corresponds to the elemental distribution of S and C in the STEM-EELS images (Photos 2 and 3), confirming that it reflects the bulk heterostructure. Additionally, a bias in the distribution of S was observed, suggesting that P3HT is segregated towards the surface side.

Company：一般財団法人材料科学技術振興財団　MST
Price：Other

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[Analysis Case] Cross-sectional Observation and Elemental Analysis of Soft Materials

Direct evaluation of the structure of solution samples through cryo-SEM observation and EDX analysis.

To observe and analyze the internal structure of organic materials and liquid samples that are sensitive to heat, it is necessary to suppress temperature increases caused by processing or electron beam irradiation and to conduct a series of analyses while maintaining the original structure of the sample. In this case study, we will introduce an example where a cosmetic was used as an evaluation sample, and structural analysis was performed from cross-section FIB processing to SEM observation and EDX analysis while maintaining a cooling environment.

Company：一般財団法人材料科学技術振興財団　MST
Price：Other

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[Analysis Case] Observation of Emulsions in Cryo FIB-SEM Processed Food

Observe the dispersion state of moisture and oil while maintaining the structure.

Emulsions are dispersion systems in which water-soluble and fat-soluble components are mixed without separation due to the action of emulsifiers, and various emulsion technologies are widely used in processed foods. Mayonnaise is a representative processed food of the O/W type (oil-in-water emulsion). As a result of evaluation using cryo FIB-SEM observation, we were able to visualize the distribution of water, oil, emulsifiers, and other components. By conducting magnified observations, we can evaluate the fine structure, which is expected to be applied to sensory evaluations such as the smoothness and flavor of food.

Company：一般財団法人材料科学技術振興財団　MST
Price：Other

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[Analysis Case] Atomic Level Structural Analysis of CIGS Thin-Film Solar Cells

Atomic-level resolution EDX analysis using Cs-corrected STEM.

By using a Cs-corrected TEM device that compensates for spherical aberration, it is possible to observe the cross-sectional structure of devices with high resolution. This case presents data from high-resolution (HR)-STEM observation and EDX elemental distribution analysis of the light-absorbing layer of CIGS thin-film solar cells. In CIGS, which has a polycrystalline structure composed of four elements, atomic resolution EDX analysis was performed, visually revealing the distribution of atoms.

Company：一般財団法人材料科学技術振興財団　MST
Price：Other

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[Analysis Case] Evaluation of Particle Size and Composition of Catalyst Materials using TEM and EDX

Evaluation of catalyst particles using STEM-EDX.

The electrodes of fuel cells are supported by Pt particles or Pt alloy (such as PtRu) particles as catalysts on carbon. Due to the fine structure of these catalyst particles, which are on the order of a few nanometers, SEM and TEM analyses are used for morphological observation and compositional analysis. In addition to evaluations in the initial state, degradation after current application has been reported, including modulation of alloy composition, leaching of Ru, and an increase in the diameter of catalyst particles; HAADF observation and high-resolution EDX analysis are very effective for these evaluations. Furthermore, multi-field observation and analysis enable the assessment of particle size and compositional distribution.

Company：一般財団法人材料科学技術振興財団　MST
Price：Other

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[Analysis Case] Investigation of Voids Inside Bonded Wafers Using C-SAM

We will evaluate the internal structure of the device in a comprehensive manner.

MST offers a range of technologies suitable for evaluating the internal structures of electronic devices, and we propose analytical methods tailored to the observation field and objectives. This document presents case studies investigating specific areas of devices using X-ray CT and FIB-SEM. First, we observed the internal structure of the entire sample using X-ray CT to explore specific areas. Next, we used FIB-SEM to examine the detailed structures of the specific features identified on the vias.

Company：一般財団法人材料科学技術振興財団　MST
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[Analysis Case] 3D Observation of Cosmetics Using X-ray CT and Cryo-SEM

It is possible to confirm the shape of emulsified particles and inorganic powders! Visualizing the film of liquid foundation from macro to micro levels.

We would like to introduce a case study of 3D observation of cosmetics using X-ray CT and cryo-SEM, analyzed by the foundation. Liquid foundation applied to a plastic substrate was observed using X-ray CT and cryo-SEM, visualizing the dispersion state within the sample. X-ray CT allows for the confirmation of macroscopic morphology in a non-destructive and non-contact manner, while cryo-SEM enables the observation of even more microscopic structures. 【Features】 ■ The internal structure of the liquid foundation film can be evaluated through macroscopic morphological observation. ■ Detailed structural observation using an electron microscope allows for the confirmation of the shapes of emulsified particles and inorganic powders. *For more details, please refer to the PDF document or feel free to contact us.

Company：一般財団法人材料科学技術振興財団　MST
Price：Other

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[Analysis Case] Structural Evaluation of Positive Electrode Active Material in Secondary Batteries

Evaluation of particle size and crystal orientation of living materials, atomic-level observation is possible.

Lithium-ion secondary batteries undergo changes in the composition and crystal structure of the electrode active materials due to ion extraction and insertion during charging and discharging. As a structural evaluation of the positive electrode active material Li(NiCoMn)O2 (NCM), we assessed the particle size and orientation of primary particles using EBSD. Furthermore, we conducted high-resolution STEM observations on the primary particles whose orientations were confirmed, showcasing the atomic positions of light elements (Li, O) in ABF-STEM images and the atomic positions of transition metals (Ni, Co, Mn) in HAADF-STEM images. Measurement methods: SEM, EBSD, TEM Product field: Secondary batteries Analysis purpose: Shape evaluation, structural evaluation, product investigation For more details, please download the materials or contact us.